Method could support semiconductor industry and facilitate development of next-gen devices.

View as a Web Page NIST, Collaborators Develop Sensitive New Way of Detecting Transistor Defects Researchers at the National Institute of Standards and Technology (NIST) and collaborators have devised and tested a new, highly sensitive method of detecting and counting defects in transistors — a matter of urgent concern to the semiconductor industry as it develops new materials for next-generation devices. These defects limit transistor and circuit performance and can affect product reliability. A typical transistor is, for most uses, basically a switch. When it's on, current flows from one side of a semiconductor to the other; switching it off stops the current. Those actions respectively create the binary 1s and 0s of digital information. Read More

Connect with us Received this email from a friend? Subscribe here.   Privacy Policy You are subscribed to receive updates from the National Institute of Standards and Technology (NIST). Subscriber services: Manage Preferences  |  Unsubscribe  |  Help

 

---

If you have questions or problems with the subscription service, please contact subscriberhelp.govdelivery.com. Technical questions? Contact inquiries@nist.gov. (301) 975-NIST (6478). This service is provided to you at no charge by National Institute of Standards and Technology (NIST). 100 Bureau Drive, Stop 1070 · Gaithersburg, MD 20899 · 301-975-6478